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| ALTAS®(No.3,203,896) Ultra High-K Single Layer Chip Capacitors, offer high capacitance
values in small size with high-frequency characteristics. |
| Utilizing dielectric materials (K=16,000 and K=30,000), ALTAS High-K capacitors
are available in two different thickness for many applications. |
Features
- Single-layer structure with excellent high-frequency characteristics
- Superior temperature characteristics
- Small size
- High RWV / High reliability
- Class IV EIA Dielectric Classification
Specs
K=16,000
| PARAMETER |
SPECIFICATION |
| Temperature Characteristics (TC) |
} 22% @ -55 to + 125 (X7S) |
| EIA Dielectric Classification |
Class IV |
| Electrode Design |
Without Border (C-type) |
| Available Chip Sizes: WxL |
10x10mils to 40x40mils
(0.25x0.25mm to 1.00x1.00mm) |
| Thickness (t) Selection |
10mils}1mil & 6mils}1mil
(0.250}0.025mm & 0.150}0.025mm) |
| Metallization (Thickness) |
Tii700 šj/ Pt i1,500 šj/ Aui4 umj |
| RWV (Rated Working Voltage) |
100V for t=10mils (0.250mm) |
| 50V for t=6mils (0.150mm) |
| Capacitance Selection |
50pF to 1,000pF @ +25 & 1kHz |
| Capacitance Tolerance Selection |
M = }20% |
| Z = -20%/ +80% |
| V = -0%/ +100% |
| DF iDissipation Factorj |
< 2.5% @+25 & 1kHz |
| IR iInsulation Resistancej |
> 1010 ¶ @ +25 |
| DWV iDielectric Withstanding Voltagej |
RWV ~ 2.5 @ +25 |
K=30,000
| PARAMETER |
SPECIFICATION |
| Temperature Characteristic (TC) |
} 15% @ -55 to + 125 (X7R) |
| EIA Dielectric Classification |
Class IV |
| Electrode Design |
Without Border (C-type) |
| Available Chip Sizes: W x L |
10x10mils to 90x90mils
(0.25x0.25mm to 2.25x2.25mm) |
| Thickness (t) Selection |
10mils}1mil & 6mils}1mil
(0.250}0.025mm & 0.150}0.025mm) |
| Metallization (Thickness) |
Tii700 šj/ Pt i1,500 šj/ Aui4 umj |
| RWV (Rated Working Voltage) |
50V for t=10mils (0.250mm) |
| 25V for t=6mils (0.150mm) |
| Capacitance Selection |
100pF to 10,000pF @ +25 & 1kHz |
| Capacitance Tolerance Selection |
M = }20% |
| Z = -20%/ +80% |
| V = -0%/ +100% |
| DF iDissipation Factorj |
< 2.5% @+25 & 1kHz |
| IR iInsulation Resistancej |
> 1010 ¶ @ +25 |
| DWV iDielectric Withstanding Voltagej |
RWV ~ 2.5 @ +25 |
Characteristic Graphs
| Typical Temperature Characteristic |
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Typical Aging Property |
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Typical DC Bias Characteristic |
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Typical Resonance Frequency |
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Selection Guide
Quality Assurance Guide
Regular Scheduled Srceening (By Lot)
| Wire bonding test |
MIL-STD-883F M2011 |
| Die shear test |
MIL-STD-883F M2019 |
| Thermal resistance test |
400 x 5 minutes |
Reliability
| Life Test |
125 ~ Working Voltage ~ 2000hr |
| Humidity Test |
85 ~ 85%RH ~ 3.0V(}0.25) ~ 240hr |
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